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Osterwalder, J.; Aebi, P.; Fasel, R.; Naumovic, D.; Schwaller, Patrick; Kreutz, T.; Schlapbach, L.; Abukawa, T.; Kono, S. (1995). Angle-scanned photoelectron diffraction Surface Science, 331-33, pp. 1002-1014. Elsevier 10.1016/0039-6028(95)00076-3