Angle-scanned photoelectron diffraction

Osterwalder, J.; Aebi, P.; Fasel, R.; Naumovic, D.; Schwaller, Patrick; Kreutz, T.; Schlapbach, L.; Abukawa, T.; Kono, S. (1995). Angle-scanned photoelectron diffraction Surface Science, 331-33, pp. 1002-1014. Elsevier 10.1016/0039-6028(95)00076-3

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A brief survey is given on the current state-of-the-art of this surface structural technique based on photoelectron spectroscopy, with particular emphasis on the progress that has been made recently by routinely measuring full-hemispherical intensity distributions. We limit the discussion to the hotoelectron forward focusing regime, which is attained at electron kinetic energies of a few hundred eV. Surface bond directions are directly revealed as pronounced maxima in the angular distributions from subsurface atoms, while characteristic interference features are observed for surface species. For both cases the dependence on the atomic type is weak enough so that these features provide a fingerprint of the local bonding geometry. For surface and near-surface species, this may then serve as a starting point for a structure refinement using single-scattering cluster calculations. Selected examples are given for illustrating these procedures.

Item Type:	Journal Article (Original Article)
Division/Institute:	School of Engineering and Computer Science > Institute for Surface Applied Laser, Phototonics and Surface Technologies ALPS
Name:	Osterwalder, J.; Aebi, P.; Fasel, R.; Naumovic, D.; Schwaller, Patrick; Kreutz, T.; Schlapbach, L.; Abukawa, T. and Kono, S.
ISSN:	0039-6028
Publisher:	Elsevier
Language:	English
Submitter:	Patrick Schwaller
Date Deposited:	10 Dec 2019 09:14
Last Modified:	14 Apr 2024 01:33
Publisher DOI:	10.1016/0039-6028(95)00076-3
ARBOR DOI:	10.24451/arbor.9286
URI:	https://arbor.bfh.ch/id/eprint/9286