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Michler, J.; Rabe, R.; Bucaille, J.-L.; Moser, B.; Schwaller, Patrick; Breguet, J.-M. (2005). Investigation of wear mechanisms through in situ observation during microscratching inside the scanning electron microscope Wear, 259(1-6), pp. 18-26. Elsevier 10.1016/j.wear.2005.02.111
Stauss, S.; Schwaller, Patrick; Bucaille, J.-L.; Rabe, R.; Rohr, L.; Michler, J.; Blank, E. (2003). Determining the stress–strain behaviour of small devices by nanoindentation in combination with inverse methods Microelectronic Engineering, 67-68, pp. 818-825. Elsevier 10.1016/S0167-9317(03)00192-8
