Riedel, G.J.

Up a level
Export as [feed] Atom [feed] RSS 1.0 [feed] RSS 2.0
Group by: Item Type | No Grouping
Number of items: 1.

Conference or Workshop Item

Grinberg, Roman; Riedel, G.J.; Dalessandro, L.; Steimer, P.; Apeldoorn, O. (2012). Analysis of failure rate prediction by using part stress method for printed circuit board assemblies in power electronics building block In: 6th IET International Conference on Power Electronics, Machines and Drives (PEMD 2012) (D51-D51). IET 10.1049/cp.2012.0335

This list was generated on Mon Dec 4 04:08:45 2023 CET.
Provide Feedback