Michler, J.

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Philippe, L.; Schwaller, Patrick; Bürki, G.; Michler, J. (2008). A comparison of microtensile and microcompression methods for studying plastic properties of nanocrystalline electrodeposited nickel at different length scales Journal of Materials Research, 23(5), pp. 1383-1388. Cambridge University Press 10.1557/JMR.2008.0162

Schwaller, Patrick; Aeberhard, M.; Nelis, Thomas; Fischer, A.; Thapliyal, R.; Michler, J. (2006). Rapid depth profiling of lead zirconate titanate (PZT) thin films by pulsed glow-discharge optical emission spectroscopy Surface and Interface Analysis, 38(4), pp. 757-760. Wiley 10.1002/sia.2264

Kern, P.; Schwaller, Patrick; Michler, J. (2006). Electrolytic deposition of titania films as interference coatings on biomedical implants: Microstructure, chemistry and nano-mechanical properties Thin Solid Films, 494(1-2), pp. 279-286. Elsevier Science 10.1016/j.tsf.2005.09.068

Michler, J.; Rabe, R.; Bucaille, J.-L.; Moser, B.; Schwaller, Patrick; Breguet, J.-M. (2005). Investigation of wear mechanisms through in situ observation during microscratching inside the scanning electron microscope Wear, 259(1-6), pp. 18-26. Elsevier 10.1016/j.wear.2005.02.111

Schwaller, Patrick; Fischer, A.; Thapliyal, R.; Aeberhard, M.; Michler, J.; Hug, H.J. (2005). Single-target DC-pulsed deposition of lead zirconate titanate thin films: Investigation of the chemical and mechanical properties by glow-discharge optical emission spectroscopy and nanoindentation Surface and Coatings Technology, 200(5-6), pp. 1566-1571. Elsevier 10.1016/j.surfcoat.2005.08.036

Schwaller, Patrick; Patscheider, J.; Kollo, L.; Michler, J. (2004). Microtribological Studies of Different Nanocomposite TiC/a-C:H Coatings Using a Modified Nanoindentation Setup Tribology Letters, 17(4), pp. 757-763. 10.1007/s11249-004-8084-y

Rabe, R.; Breguet, J.-M.; Schwaller, Patrick; Stauss, S.; Haug, F.-J.; Patscheider, J.; Michler, J. (2004). Observation of fracture and plastic deformation during indentation and scratching inside the scanning electron microscope Thin Solid Films, 469-47, pp. 206-213. Elsevier Science 10.1016/j.tsf.2004.08.096

Stauss, S.; Schwaller, Patrick; Bucaille, J.-L.; Rabe, R.; Rohr, L.; Michler, J.; Blank, E. (2003). Determining the stress–strain behaviour of small devices by nanoindentation in combination with inverse methods Microelectronic Engineering, 67-68, pp. 818-825. Elsevier 10.1016/S0167-9317(03)00192-8

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