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  4. Analysis of failure rate prediction by using part stress method for printed circuit board assemblies in power electronics building block
 

Analysis of failure rate prediction by using part stress method for printed circuit board assemblies in power electronics building block

URI
https://arbor.bfh.ch/handle/arbor/31642
Version
Published
Date Issued
2012
Author(s)
Grinberg, Roman  
Riedel, G.J.
Dalessandro, L.
Steimer, P.
Apeldoorn, O.
Type
Conference Paper
Language
English
Abstract
In this paper, the reliability prediction of a power electronics building block (PEBB) printed circuit board assembly (PCBA) is performed using the Part Stress Method from the MIL-HDBK-217FN2 handbook. The breakdown of the predicted reliability with respect to circuit functional blocks is presented. Furthermore, different cases are shown, where the components with small or large failure rate dominate. Finally, the ANSI-VITA51.1 adjustments are applied and their influence on the reliability prediction results and their usage are discussed.
ISBN
978-1-84919-616-1
Publisher DOI
10.1049/cp.2012.0335
Publisher URL
https://digital-library.theiet.org/content/conferences/10.1049/cp.2012.0335
Related URL
https://ieeexplore.ieee.org/document/6242187 publication
Organization
Institut für Energie- und Mobilitätsforschung IEM  
IEM / Hochspannung  
Technik und Informatik  
Conference
6th IET International Conference on Power Electronics, Machines and Drives (PEMD 2012)
Publisher
IET
Submitter
Grinberg, Roman
Citation apa
Grinberg, R., Riedel, G. J., Dalessandro, L., Steimer, P., & Apeldoorn, O. (2012). Analysis of failure rate prediction by using part stress method for printed circuit board assemblies in power electronics building block. 6th IET International Conference on Power Electronics, Machines and Drives (PEMD 2012). IET. https://arbor.bfh.ch/handle/arbor/31642
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