Analysis of failure rate prediction by using part stress method for printed circuit board assemblies in power electronics building block
Version
Published
Date Issued
2012
Author(s)
Type
Conference Paper
Language
English
Abstract
In this paper, the reliability prediction of a power electronics building block (PEBB) printed circuit board assembly (PCBA) is performed using the Part Stress Method from the MIL-HDBK-217FN2 handbook. The breakdown of the predicted reliability with respect to circuit functional blocks is presented. Furthermore, different cases are shown, where the components with small or large failure rate dominate. Finally, the ANSI-VITA51.1 adjustments are applied and their influence on the reliability prediction results and their usage are discussed.
ISBN
978-1-84919-616-1
Publisher DOI
Conference
6th IET International Conference on Power Electronics, Machines and Drives (PEMD 2012)
Publisher
IET
Submitter
Grinberg, Roman
Citation apa
Grinberg, R., Riedel, G. J., Dalessandro, L., Steimer, P., & Apeldoorn, O. (2012). Analysis of failure rate prediction by using part stress method for printed circuit board assemblies in power electronics building block. 6th IET International Conference on Power Electronics, Machines and Drives (PEMD 2012). IET. https://arbor.bfh.ch/handle/arbor/31642
