Greber, T.; Raetzo, O.; Kreutz, T. J.; Schwaller, Patrick; Deichmann, W.; Wetli, E.; Osterwalder, J. (1997). A photoelectron spectrometer for k-space mapping above the Fermi level Review of Scientific Instruments, 68(12), pp. 4549-4554. American Institute of Physics (AIP) 10.1063/1.1148429
Full text not available from this repository. (Request a copy)The setup of an electron spectrometer for angle-resolved photoemission is described. A sample goniometer offers the opportunity for angle scanned photoemission over 2π solid angle above the surface. A monochromatized high flux He discharge photon source is exploited to measure thermally populated electronic states above the Fermi level EF. At energies greater than EF+5kBT the signal from a constant density of states declines below the photoelectron background caused by photons with higher energies than He Iα (21.2 eV). For He IIα (40.8 eV) the residual photoelectron background is lower and photoemission up to 6kBT above EF can be performed. Data showing two cuts through the Fermi surface of silver are presented. Furthermore the dispersion of the Shockley surface state on Ag (111) above the Fermi energy is quantified.
Item Type: |
Journal Article (Original Article) |
---|---|
Division/Institute: |
School of Engineering and Computer Science > Institute for Surface Applied Laser, Phototonics and Surface Technologies ALPS School of Engineering and Computer Science |
Name: |
Greber, T.; Raetzo, O.; Kreutz, T. J.; Schwaller, Patrick; Deichmann, W.; Wetli, E. and Osterwalder, J. |
ISSN: |
0034-6748 |
Publisher: |
American Institute of Physics (AIP) |
Language: |
English |
Submitter: |
Patrick Schwaller |
Date Deposited: |
09 Dec 2019 17:24 |
Last Modified: |
09 Dec 2019 17:24 |
Publisher DOI: |
10.1063/1.1148429 |
URI: |
https://arbor.bfh.ch/id/eprint/9283 |