On reliability of medium voltage multilevel converters

Grinberg, Roman; Riedel, G.; Korn, A.; Steimer, P.; Bjornstad, E. (2013). On reliability of medium voltage multilevel converters In: 2013 IEEE Energy Conversion Congress and Exposition (ECCE) (pp. 4047-4052). IEEE 10.1109/ECCE.2013.6647238

Text On_reliability_of_medium_voltage_multilevel_converters.pdf - Published Version Restricted to registered users only Available under License Publisher holds Copyright. Download (1MB) | Request a copy

In this paper, the reliability of medium voltage multilevel converters based on cascaded cells is investigated. Limits of reliability prediction and redundancy application are shown. Opportunities to leverage converter predicted reliability with redundancy are analyzed. Special attention is given to the impact of the bypass device on converter reliability. The analysis shows significant influence of redundancy on power stage failure rate reduction. At a certain redundancy level though, control hardware will play a dominant limiting role in converter reliability. The analysis also shows the existence of maximum power stage redundancy level for a given bypass failure rate. Exceeding this level results in reduction of converter reliability. This work was carried out within the frame of European FP7 program and its support is gratefully acknowledged.

Item Type:	Conference or Workshop Item (Paper)
Division/Institute:	School of Engineering and Computer Science
Name:	Grinberg, Roman; Riedel, G.; Korn, A.; Steimer, P. and Bjornstad, E.
Subjects:	T Technology > TK Electrical engineering. Electronics Nuclear engineering
ISBN:	978-1-4799-0336-8
Publisher:	IEEE
Language:	English
Submitter:	Roman Grinberg
Date Deposited:	21 Sep 2021 11:27
Last Modified:	23 Sep 2021 07:56
Publisher DOI:	10.1109/ECCE.2013.6647238
ARBOR DOI:	10.24451/arbor.15421
URI:	https://arbor.bfh.ch/id/eprint/15421