On reliability of medium voltage multilevel converters

Grinberg, Roman; Riedel, G.; Korn, A.; Steimer, P.; Bjornstad, E. (2013). On reliability of medium voltage multilevel converters In: 2013 IEEE Energy Conversion Congress and Exposition (ECCE) (pp. 4047-4052). IEEE 10.1109/ECCE.2013.6647238

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In this paper, the reliability of medium voltage multilevel converters based on cascaded cells is investigated. Limits of reliability prediction and redundancy application are shown. Opportunities to leverage converter predicted reliability with redundancy are analyzed. Special attention is given to the impact of the bypass device on converter reliability. The analysis shows significant influence of redundancy on power stage failure rate reduction. At a certain redundancy level though, control hardware will play a dominant limiting role in converter reliability. The analysis also shows the existence of maximum power stage redundancy level for a given bypass failure rate. Exceeding this level results in reduction of converter reliability. This work was carried out within the frame of European FP7 program and its support is gratefully acknowledged.

Item Type:

Conference or Workshop Item (Paper)

Division/Institute:

School of Engineering and Computer Science

Name:

Grinberg, Roman;
Riedel, G.;
Korn, A.;
Steimer, P. and
Bjornstad, E.

Subjects:

T Technology > TK Electrical engineering. Electronics Nuclear engineering

ISBN:

978-1-4799-0336-8

Publisher:

IEEE

Language:

English

Submitter:

Dr Roman Grinberg

Date Deposited:

21 Sep 2021 11:27

Last Modified:

23 Sep 2021 07:56

Publisher DOI:

10.1109/ECCE.2013.6647238

ARBOR DOI:

10.24451/arbor.15421

URI:

https://arbor.bfh.ch/id/eprint/15421

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