Neuenschwander, Beat; Jaeggi, Beat; Schmid, Marc (2012). From ps to fs: Dependence of the material removal rate and the surface quality on the pulse duration for metals, semiconductors and oxides In: ICALEO® 2012: 31st International Congress on Laser Materials Processing, Laser Microprocessing and Nanomanufacturing (pp. 959-968). Laser Institute of America 10.2351/1.5062570
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Item Type: |
Conference or Workshop Item (Paper) |
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Division/Institute: |
School of Engineering and Computer Science > Institute for Surface Applied Laser, Phototonics and Surface Technologies ALPS |
Name: |
Neuenschwander, Beat 0000-0001-9715-8557; Jaeggi, Beat and Schmid, Marc |
Subjects: |
Q Science > QC Physics |
ISBN: |
978-0-912035-96-3 |
Publisher: |
Laser Institute of America |
Language: |
English |
Submitter: |
Beat Neuenschwander |
Date Deposited: |
21 Apr 2020 12:08 |
Last Modified: |
04 Nov 2021 21:46 |
Publisher DOI: |
10.2351/1.5062570 |
Additional Information: |
This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing |
ARBOR DOI: |
10.24451/arbor.11320 |
URI: |
https://arbor.bfh.ch/id/eprint/11320 |
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